edwards_1985#
D. F. Edwards, “Silicon (Si)”, in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic Press, 1985), pp. 547-569
Source record · Catalogue · Review register
DOI: 10.1016/b978-0-08-054721-3.50029-0
Source kind: compilation
Recorded technique: A critical compilation of the optical constants of crystalline silicon at room temperature from 2000 eV (6.2 A) to 0.00372 eV (333 um), each range from a different original (text pp. 547-552): values computed by Edwards from Henke et al.’s atomic scattering factors (99-2000 eV); absorption near the L2,3 edge (Gahwiller and Brown; Brown, Bachrach and Skibowski; synchrotron); Hunter’s unpublished critical-angle n and transmission k of evaporated films (20-95 eV); Philipp’s Kramers-Kronig analysis of reflectance (5-20 eV); Aspnes and Theeten’s spectroscopic ellipsometry, combined with Hulthen’s eps_2 below 2.5 eV (1.5-6.0 eV); Hulthen’s transmission of epitaxial films, read from his graphs, and McFarlane and Roberts’ absorption (band edge, k only); minimum-deviation and channel-spectrum indices (Primak; Salzberg and Villa; Edwards and Ochoa; Loewenstein et al.; Randall and Rawcliffe; 1.12-333 um); photoacoustic (Hordvik and Skolnik), multiphonon absorption (Johnson; Bendow et al.) and far-infrared Fourier-transform (Afsar and Hasted) k.
Materials in structured entries: Si
Dataset quantities: extinction_coefficient, refractive_index
Contents: 20 datasets; 0 formulas.
Curation notes#
Chapter pages 547-569 are pdf pages 1-23: text pp. 547-552 (pdf 1-6), references pp. 552-553, Fig. 11 (log-log plot of n and k against wavelength, figure only) p. 554, Table XII pp. 555-568 (pdf 9-22, fourteen parts), Table XIII p. 569. Identity checked against the first page.
WHAT TABLE XII HOLDS. ‘Values of n and k for Silicon Obtained from Various References’ (caption; footnote a: ‘References are indicated in brackets’). For every row: photon energy (eV), the wavenumber (cm-1, from 6.0 eV down only), the wavelength (angstrom to 650 A, micrometre from 0.06526 um: the unit switches at the p. 560 part), and two pairs of n and k columns. A reference tag in brackets after a value names the original of that value and of the values below it in the same column, until the next tag; the second pair holds a second original where two overlap (Gahwiller-Brown and Brown et al. beside the Henke calculation; Aspnes and Theeten beside Philipp; McFarlane and Roberts beside Hulthen). The datasets below are one per column kind (n, k), tag and, for Philipp’s values, wavelength unit. Every k printed as a bare mantissa inherits the power of ten of the cell above it in its column (see the extraction script); every part was compared with its table image, cell by cell. The table prints no stated uncertainty.
ROWS WITHOUT AN ENERGY. Six lines print no energy or wavelength, only a second value under the line above: Philipp’s n and k at 20.00 eV (620 A) under Hunter’s, and Johnson’s k under Bendow et al.’s at 7.143, 7.692, 8.333 and 9.091 um. Each takes the wavelength of the line above (both originals’ grids put it there: Philipp’s 0.5-eV grid, and the page break after 7.692 um).
CROSS-CHECK. eV x wavelength agrees with hc to the printed digits on every row but one: the 640 A row prints 10.37 eV for 19.37 eV (hc/640 A = 19.373 eV; the rows around it are 19.5 and 19.07 eV). The wavenumber agrees with the wavelength on every row but three: 1,492 cm-1 for 1,429 at 7.00 um (0.1771 eV), 608 for 606 at 16.50 um (0.07513 eV; the text names this band ‘the peak at 606 cm-1’, p. 548) and 21,660 for about 21,620 at 0.4626 um (2.68 eV). The abscissa here is the wavelength, which is right on all three rows, so none of these needs an erratum.
RANGES AND ORIGINALS (text pp. 547-552; references p. 552-553): - 2000-100 eV n and k [30]: ‘From 99 to 2000 eV we have calculated n and k from a model of Henke et al. [30] as discussed by Lynch and Hunter in the metal section of this handbook. While the calculation cannot account for the fine structure, the magnitude of k is in reasonable agreement with experiment [31, 32].’ The steps of k at 1815-1860 eV (the K edge) and at 100-101.6 eV (the L2,3 edge) are as printed. The 166 and 162 eV rows print the same n and k (0.99235, 1.45e-2), against the trend of both columns (170 eV: 0.99176, 1.28e-2; 158 eV: 0.99287, 1.52e-2); probably a repeated line, kept as printed. - 210-110 eV and 95 eV k [31] (Gahwiller and Brown 1970) and 105-99.0 eV k [32] (Brown, Bachrach and Skibowski 1977): the absorption near the L2,3 edge, ‘measured [31, 32] with chemically etched and polished samples and with films flash evaporated onto NaCl substrates and floated off; the latter were polycrystalline. A synchrotron source was used’ (p. 552). Which sample goes with which reference is not said. - 99.19-19.07 eV n and k [29]: Hunter’s ‘private communication of unpublished data (1982)’, ‘For the range 20-95 eV ... Samples were evaporated Si on glass plates for measurement of n by a critical-angle method; they were freestanding for measurement of k by transmission. While the samples were probably amorphous, we find that the data fit reasonably well between the results of Henke [30] and Philipp [26]’ (p. 552). ‘An interpolation has been done between 95 and 99 eV to keep the continuity’ (p. 552): the four rows above 95 eV (125-130 A) carry Hunter’s tag but are Edwards’ interpolation (excluded rows). Hunter’s methods paper (Appl. Opt. 21, 2103 (1982)) is in the library without tables. - 20.0-5.0 eV n and k [26]: Philipp, J. Appl. Phys. 43, 2836 (1972), and private communication (1982); Kramers-Kronig analysis of reflectance on ‘chemically prepared surfaces with minimum time spent in air before insertion into the vacuum spectrometer’ (p. 551); ‘we have therefore elected to tabulate the Philipp data from 5 to 25 eV’ (only 20.0-5.0 eV is printed). Philipp’s and Sasaki and Ishiguro’s data agree within ‘typically <~30% for n but <~10% for k’; Aspnes and Theeten’s and Philipp’s within ‘<~5% for k and <~10% for n in the overlap region 5-6 eV’ (pp. 551-552). The table does NOT cite Philipp and Ehrenreich, Phys. Rev. 129, 1550 (1963) (philipp_1963); it cites Philipp and Taft 1960 [25], Philipp 1972 [26] and Philipp and Ehrenreich 1967 (in Semiconductors and Semimetals, Vol. 2) [27], and tags only [26]. - 6.0-1.5 eV n and k [20]: Aspnes and Theeten, J. Electrochem. Soc. 127, 1359 (1980), and private communication (1980): spectroscopic ellipsometry on {100}, {111} and {110} wafers (~26 ohm cm, Syton polished, oxides grown, stripped and regrown), the oxide and its 6-A transition layer removed mathematically. ‘Temperature was not stated but was probably 298 K.’ ‘The data were combined with eps_2 data of Hulthen [21] below 2.5 eV to generate the final values we have tabulated’ (pp. 551-552): below 2.5 eV the k column is in part Hulthen’s. Not Aspnes and Studna 1983 (aspnes_1983), whose Si values are a different measurement. - 2.0-1.2 eV k [21]: Hulthen, Phys. Scr. 12, 342 (1975), transmission of epitaxial films on sapphire; ‘We obtained n and k from reading graphs [21]’ (p. 552): read from figures by Edwards. ‘Temperature was not stated but was probably 298 K.’ - 1.28-1.06 eV k [23] (0.9686-1.170 um): McFarlane and Roberts, Phys. Rev. 98, 1865 (1955), absorption at 290 K on 100 ohm cm material, mechanically polished; at 1.2 eV a ‘factor of 5 difference’ from Hulthen’s (p. 552; here 1.8e-4 against 1.07e-3). - 1.12-25.00 um n [1, 2, 3, 8]: Edwards’ selection of ‘representative ... average values’ from Primak [1] (1.12-2.16 um, minimum deviation), Salzberg and Villa [2] (1.3570-11.04 um, minimum deviation), Edwards and Ochoa [3] (2.4373-25 um, channel spectra), with Icenogle et al. [4]; criteria: single crystals, values readable ‘to at least a few places in the third decimal place’, and ‘agreement in overlap areas to less than five in the third place between different data sets’ (p. 547). Tag [8] is Li, J. Phys. Chem. Ref. Data 9, 561 (1980) (li_1980), the source of the Sellmeier form; the printed values are not Li’s Table 1 at 293 K (3.5167 at 1.20 um and 3.4719 at 1.60 um, against 3.5193 and 3.4710 here), but Li compiles the same measurements, so li_1980 is listed among the originals. Each investigator’s samples were at room temperature; the dispersion fits of p. 548 are for 26 C. - 30.30-333.3 um n [5, 6]: Loewenstein, Smith and Morgan (28.57-333 um) and Randall and Rawcliffe (67.8-588 um), channel spectra, room temperature (pp. 547-548). - 2.7144 and 3.80 um k [12]: Hordvik and Skolnik, photoacoustic absorption at the HF and DF laser lines (p. 549). - 5.00-7.692 um, 8.000-9.091 um k [15] and 7.143-29.41 um k [14]: Bendow, Lipson and Yukon, and Johnson (oxygen-free silicon, 6.7-25 um), the multiphonon absorption ‘for the major absorption peaks and shoulders’ (p. 549). The two alternate between 7.1 and 9.1 um, each line tagged; from 9.259 um on the column carries Johnson’s tag. The 1450 cm-1 value (2.45e-5 at 6.897 um, printed with its power) is ten times its neighbours (2.66e-6 at 6.667 um); kept as printed. - 62.50-250.0 um k [19]: Afsar and Hasted, Fourier-transform spectroscopy, 1000 ohm cm, 303 K; chosen ‘for k below 160 cm-1’ because the highest resistivity ‘should minimize the free-carrier effects on k’ (p. 550).
USE. Hunter’s otherwise unpublished data are primary (as in philipp_1985), filed under crystalline Si with form = film although Edwards calls the samples ‘probably amorphous’. Every other range reproduces another work and is ‘reproduced’; none of those originals is in the library with these values, so they remain the best copies available (an original curated later is named in reproduced_from). The temperature is room temperature (not stated) except where a dataset says so. Wavelengths are vacuum values (computed from the photon energy in the VUV; the infrared rows are on a wavenumber grid).
NOT TRANSCRIBED. The Herzberger-type (A = 3.41906, B = 1.23172e-1, C = 2.65456e-2, D = -2.66511e-8, E = 5.45852e-14, L = 1/(lambda^2 - 0.028)) and Sellmeier-type (eps = 1.16858e1, A = 9.39816e-1, B = 8.10461e-3, lambda_1 = 1.1071 um) fits to the 184 infrared index points, 1.12-588 um, 26 C (p. 548); Table XIII (p. 569), Icenogle et al.’s dn/dT = B1 + B2 T + B3 T^2 for 100-296 K at four wavelengths, 2.554-10.270 um (its B1 at 2.732 um, -1.0255e-5, is ten times smaller than its neighbours’); the Drude model of Kinasewitz and Senitzky at 107.3 GHz (p. 552).
Recorded bibliographic identity status: VALIDATED_WITH_WARNINGS. This concerns identification of the source; it does not establish the scientific correctness of its contents.
Datasets#
edwards_1985/henke_n#
{
"id": "henke_n",
"material": "Si",
"file": "Si/edwards_1985__henke_n.csv",
"table": "tbl_fe55a657b8ec",
"quantity": "refractive_index",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro and B. K. Fujikawa, in Low Energy X-Ray Diagnostics-1981, D. T. Attwood and B. L. Henke, eds., AIP Conference Proc. No. 75 (American Institute of Physics, New York, 1981), p. 340"
]
}
Table XII, 2000-100 eV (6.199-124.0 A; parts tbl_fe55a657b8ec, tbl_646c7991193c, tbl_c55280ac2760, tbl_3ad03cca75e0), tag [30]: n calculated by Edwards from Henke et al.’s model (p. 552). A calculation, not a measurement. henke_1993 is the later version of Henke’s tables, not this one.
edwards_1985/henke_k#
{
"id": "henke_k",
"material": "Si",
"file": "Si/edwards_1985__henke_k.csv",
"table": "tbl_fe55a657b8ec",
"quantity": "extinction_coefficient",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"B. L. Henke, P. Lee, T. J. Tanaka, R. L. Shimabukuro and B. K. Fujikawa, in Low Energy X-Ray Diagnostics-1981, D. T. Attwood and B. L. Henke, eds., AIP Conference Proc. No. 75 (American Institute of Physics, New York, 1981), p. 340"
]
}
As henke_n, k. Mantissas under a printed power of ten inherit it (extraction script). The steps at 1815-1860 eV (K edge) and 100-101.6 eV (L2,3 edge) are as printed; so are the identical 166 and 162 eV rows (record notes).
edwards_1985/gahwiller_brown_k#
{
"id": "gahwiller_brown_k",
"material": "Si",
"file": "Si/edwards_1985__gahwiller_brown_k.csv",
"table": "tbl_c55280ac2760",
"quantity": "extinction_coefficient",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"C. Gahwiller and F. C. Brown, Proc. Int. Conf. Phys. Semicond., 10th, Cambridge, 1970 (U.S. Atomic Energy Commission, Oak Ridge, 1970), p. 213"
],
"parameters": {
"technique": "transmission"
}
}
Table XII second k column, 210-110 eV (59.04-112.7 A) and the 95 eV row (130.5 A), tag [31]: absorption near the L2,3 edge with synchrotron radiation (p. 552). The 95 eV value ‘4.9 [31]’ inherits 10^-3 from the column above (Brown et al.’s 9.7e-3 to 3.4e-3).
edwards_1985/brown_k#
{
"id": "brown_k",
"material": "Si",
"file": "Si/edwards_1985__brown_k.csv",
"table": "tbl_3ad03cca75e0",
"quantity": "extinction_coefficient",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"F. C. Brown, R. Z. Bachrach and M. Skibowski, Phys. Rev. B 15, 478 (1977)"
],
"parameters": {
"technique": "transmission"
}
}
Table XII second k column, 105-99.0 eV (118.1-125.2 A) in 0.2 eV steps, tag [32]: absorption through the L2,3 edge with synchrotron radiation (p. 552); the edge is the fall from 1.00e-2 at 100.2 eV to 4.9e-3 at 99.8 eV. ‘1.08 [32]’ inherits 10^-2 from Gahwiller and Brown’s 1.38e-2 above it.
edwards_1985/hunter_n#
{
"id": "hunter_n",
"material": "Si",
"file": "Si/edwards_1985__hunter_n.csv",
"table": "tbl_5f02459e2946",
"quantity": "refractive_index",
"abscissa_unit": "angstrom",
"use": "primary",
"excluded_rows": {
"171": "Edwards' interpolation between 95 and 99 eV 'to keep the continuity' (p. 552), not Hunter's data",
"173": "Edwards' interpolation between 95 and 99 eV (p. 552)",
"174": "Edwards' interpolation between 95 and 99 eV (p. 552)",
"175": "Edwards' interpolation between 95 and 99 eV (p. 552)"
},
"parameters": {
"form": "film",
"technique": "critical angle"
}
}
Table XII, 125-650 A (99.19-19.07 eV; parts tbl_3ad03cca75e0 and tbl_5f02459e2946), tag [29]: W. R. Hunter, private communication of unpublished data (1982), n by a critical-angle method on Si evaporated on glass plates; ‘the samples were probably amorphous’ (p. 552). First published here. The four rows above 95 eV are Edwards’ interpolation (excluded). The 640 A row prints 10.37 eV for 19.37 eV (record notes).
edwards_1985/hunter_k#
{
"id": "hunter_k",
"material": "Si",
"file": "Si/edwards_1985__hunter_k.csv",
"table": "tbl_5f02459e2946",
"quantity": "extinction_coefficient",
"abscissa_unit": "angstrom",
"use": "primary",
"excluded_rows": {
"171": "Edwards' interpolation between 95 and 99 eV 'to keep the continuity' (p. 552), not Hunter's data",
"173": "Edwards' interpolation between 95 and 99 eV (p. 552)",
"174": "Edwards' interpolation between 95 and 99 eV (p. 552)",
"175": "Edwards' interpolation between 95 and 99 eV (p. 552)"
},
"parameters": {
"form": "film",
"technique": "transmission"
}
}
As hunter_n, k, by transmission of freestanding films (p. 552). ‘1.0 [29]’ at 125 A inherits 10^-3 from the Henke column above; the 630 A value (9.3e-2) is untagged under Philipp’s 0.122 [26] but is Hunter’s (its row’s n is tagged [29], and it lies on Hunter’s 10-A grid; extraction script). The 330 A value prints ‘1.0’ (1.0e-2) between 1.04e-2 and 1.13e-2; kept as printed.
edwards_1985/philipp_n_angstrom#
{
"id": "philipp_n_angstrom",
"material": "Si",
"file": "Si/edwards_1985__philipp_n_angstrom.csv",
"table": "tbl_5f02459e2946",
"quantity": "refractive_index",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"H. R. Philipp, J. Appl. Phys. 43, 2836 (1972); H. R. Philipp, private communication (1982)"
],
"parameters": {
"form": "bulk",
"technique": "Kramers-Kronig analysis of reflectance"
}
}
Table XII, 20.0 and 19.5 eV (620 and 635.8 A), tag [26], printed in the angstrom part between Hunter’s rows: Philipp’s Kramers-Kronig n (p. 551). The 20.0 eV value is printed on a line of its own under Hunter’s 20.00 eV row and takes its wavelength. Continued in micrometres by philipp_n_um.
edwards_1985/philipp_k_angstrom#
{
"id": "philipp_k_angstrom",
"material": "Si",
"file": "Si/edwards_1985__philipp_k_angstrom.csv",
"table": "tbl_5f02459e2946",
"quantity": "extinction_coefficient",
"abscissa_unit": "angstrom",
"use": "reproduced",
"reproduced_from": [
"H. R. Philipp, J. Appl. Phys. 43, 2836 (1972); H. R. Philipp, private communication (1982)"
],
"parameters": {
"form": "bulk",
"technique": "Kramers-Kronig analysis of reflectance"
}
}
As philipp_n_angstrom, k.
edwards_1985/philipp_n_um#
{
"id": "philipp_n_um",
"material": "Si",
"file": "Si/edwards_1985__philipp_n_um.csv",
"table": "tbl_465e3c66d70e",
"quantity": "refractive_index",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"H. R. Philipp, J. Appl. Phys. 43, 2836 (1972); H. R. Philipp, private communication (1982)"
],
"parameters": {
"form": "bulk",
"technique": "Kramers-Kronig analysis of reflectance"
}
}
Table XII, 19.0-5.0 eV (0.06526-0.2480 um; parts tbl_465e3c66d70e, tbl_0f7731d732b9, tbl_6a64c6e4156f), tag [26]: Philipp’s Kramers-Kronig n on chemically prepared surfaces (p. 551), mostly in 0.25-eV steps above 6 eV and 0.1-0.2-eV steps below. Within ‘<~10%’ of Aspnes and Theeten’s n in 5-6 eV (pp. 551-552).
edwards_1985/philipp_k_um#
{
"id": "philipp_k_um",
"material": "Si",
"file": "Si/edwards_1985__philipp_k_um.csv",
"table": "tbl_465e3c66d70e",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"H. R. Philipp, J. Appl. Phys. 43, 2836 (1972); H. R. Philipp, private communication (1982)"
],
"parameters": {
"form": "bulk",
"technique": "Kramers-Kronig analysis of reflectance"
}
}
As philipp_n_um, k: within ‘<~5%’ of Aspnes and Theeten’s k in 5-6 eV (p. 552).
edwards_1985/aspnes_theeten_n#
{
"id": "aspnes_theeten_n",
"material": "Si",
"file": "Si/edwards_1985__aspnes_theeten_n.csv",
"table": "tbl_0f7731d732b9",
"quantity": "refractive_index",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"D. E. Aspnes and J. B. Theeten, J. Electrochem. Soc. 127, 1359 (1980); D. E. Aspnes and J. B. Theeten, private communication (1980)"
],
"parameters": {
"form": "bulk",
"technique": "spectroscopic ellipsometry"
}
}
Table XII second n column, 6.0-1.5 eV in 0.02-eV steps (0.2066-0.8266 um; parts tbl_0f7731d732b9 to tbl_afc5f60ea2d9), tag [20]: spectroscopic ellipsometry, the oxide and transition layer removed mathematically, ‘combined with eps_2 data of Hulthen [21] below 2.5 eV’ (pp. 551-552). Temperature not stated (‘probably 298 K’). Not aspnes_1983.
edwards_1985/aspnes_theeten_k#
{
"id": "aspnes_theeten_k",
"material": "Si",
"file": "Si/edwards_1985__aspnes_theeten_k.csv",
"table": "tbl_0f7731d732b9",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"D. E. Aspnes and J. B. Theeten, J. Electrochem. Soc. 127, 1359 (1980); D. E. Aspnes and J. B. Theeten, private communication (1980)",
"R. Hulthen, Phys. Scr. 12, 342 (1975)"
],
"parameters": {
"form": "bulk",
"technique": "spectroscopic ellipsometry"
}
}
As aspnes_theeten_n, k. Below 2.5 eV the values are combined with Hulthen’s eps_2 (p. 552); printed to three decimals, they fall to 0.005 at 1.5 eV and are not monotonic below 2.7 eV (e.g. 0.131, 0.134, 0.120 at 2.68-2.64 eV), as printed.
edwards_1985/hulthen_k#
{
"id": "hulthen_k",
"material": "Si",
"file": "Si/edwards_1985__hulthen_k.csv",
"table": "tbl_afc5f60ea2d9",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"R. Hulthen, Phys. Scr. 12, 342 (1975)"
],
"parameters": {
"form": "film",
"technique": "transmission"
}
}
Table XII first k column, 2.0-1.2 eV (0.6199-1.033 um; parts tbl_afc5f60ea2d9, tbl_1eb73f7d4ec6), tag [21]: transmission of epitaxial films on sapphire, read by Edwards from Hulthen’s graphs (p. 552). Temperature not stated (‘probably 298 K’). Mantissas inherit the power printed above them.
edwards_1985/mcfarlane_roberts_k#
{
"id": "mcfarlane_roberts_k",
"material": "Si",
"file": "Si/edwards_1985__mcfarlane_roberts_k.csv",
"table": "tbl_afc5f60ea2d9",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"G. G. McFarlane and V. Roberts, Phys. Rev. 98, 1865 (1955)"
],
"parameters": {
"temperature_k": 290,
"form": "bulk",
"technique": "transmission"
}
}
Table XII second k column, 1.28-1.06 eV (0.9686-1.170 um; parts tbl_afc5f60ea2d9, tbl_1eb73f7d4ec6), tag [23]: absorption at 290 K on 100 ohm cm material, mechanically polished; a factor of 5 below Hulthen’s at 1.2 eV (p. 552).
edwards_1985/ir_n#
{
"id": "ir_n",
"material": "Si",
"file": "Si/edwards_1985__ir_n.csv",
"table": "tbl_1eb73f7d4ec6",
"quantity": "refractive_index",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"W. Primak, Appl. Opt. 10, 759 (1971)",
"C. D. Salzberg and J. J. Villa, J. Opt. Soc. Am. 47, 244 (1957)",
"D. F. Edwards and E. Ochoa, Appl. Opt. 19, 4130 (1980)",
"li_1980"
],
"parameters": {
"form": "bulk",
"technique": "minimum deviation and channel spectra"
}
}
Table XII, 1.12-25.00 um (parts tbl_1eb73f7d4ec6, tbl_f5e644f1b126, tbl_f4f72cdf8301), tag [1, 2, 3, 8]: Edwards’ selected ‘representative ... average values’ of single-crystal minimum-deviation and channel-spectrum indices at room temperature (p. 547); four decimals. Li 1980 [8] compiles the same measurements but its Table 1 differs (record notes). From 2.4373 um on, the values equal Edwards and Ochoa’s 1980 Herzberger-type formula (coefficients as refractiveindex.info’s main/Si/nk/Edwards.yml gives them, a comparison only) within +-0.5e-4 on all 19 rows, i.e. to the printed rounding: there they are Edwards and Ochoa’s fitted index. Never fitted beside those originals.
edwards_1985/far_ir_n#
{
"id": "far_ir_n",
"material": "Si",
"file": "Si/edwards_1985__far_ir_n.csv",
"table": "tbl_f4f72cdf8301",
"quantity": "refractive_index",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"E. V. Loewenstein, D. R. Smith and R. L. Morgan, Appl. Opt. 12, 398 (1973)",
"C. M. Randall and R. D. Rawcliffe, Appl. Opt. 6, 1889 (1967)"
],
"parameters": {
"form": "bulk",
"technique": "channel spectra"
}
}
Table XII, 30.30-333.3 um, tag [5, 6]: channel spectra at room temperature (pp. 547-548); 3.4200 to 3.4155.
edwards_1985/hordvik_skolnik_k#
{
"id": "hordvik_skolnik_k",
"material": "Si",
"file": "Si/edwards_1985__hordvik_skolnik_k.csv",
"table": "tbl_1eb73f7d4ec6",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"A. Hordvik and L. Skolnik, Appl. Opt. 16, 2919 (1977)"
],
"parameters": {
"form": "bulk",
"technique": "photoacoustic"
}
}
Table XII, 2.7144 and 3.80 um, tag [12]: photoacoustic absorption at the HF and DF laser lines (p. 549); 2.5e-9 and 1.3e-8.
edwards_1985/bendow_k#
{
"id": "bendow_k",
"material": "Si",
"file": "Si/edwards_1985__bendow_k.csv",
"table": "tbl_1eb73f7d4ec6",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"B. Bendow, H. G. Lipson and S. P. Yukon, Appl. Opt. 16, 2909 (1977)"
],
"parameters": {
"form": "bulk",
"technique": "transmission"
}
}
Table XII, 5.00-9.091 um (parts tbl_1eb73f7d4ec6, tbl_f5e644f1b126), tag [15]: multiphonon absorption ‘for the major absorption peaks and shoulders’ (p. 549). The 6.897 um value (2.45e-5, its power printed) is ten times the 6.667 um value; kept as printed.
edwards_1985/johnson_k#
{
"id": "johnson_k",
"material": "Si",
"file": "Si/edwards_1985__johnson_k.csv",
"table": "tbl_1eb73f7d4ec6",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"F. A. Johnson, Proc. Phys. Soc. London 73, 265 (1959)"
],
"parameters": {
"form": "bulk",
"technique": "transmission"
}
}
Table XII, 7.143-29.41 um (parts tbl_1eb73f7d4ec6, tbl_f5e644f1b126, tbl_f4f72cdf8301), tag [14]: two-phonon absorption of oxygen-free silicon (p. 549). Four values are printed on lines of their own under Bendow et al.’s (7.143, 7.692, 8.333, 9.091 um) and take that line’s wavelength. The 606 cm-1 peak is 1.25e-3 (16.50 um), the ‘9.5 cm-1’ of p. 550.
edwards_1985/afsar_hasted_k#
{
"id": "afsar_hasted_k",
"material": "Si",
"file": "Si/edwards_1985__afsar_hasted_k.csv",
"table": "tbl_f4f72cdf8301",
"quantity": "extinction_coefficient",
"abscissa_unit": "um",
"use": "reproduced",
"reproduced_from": [
"M. N. Afsar and J. B. Hasted, Infrared Phys. 18, 835 (1978)"
],
"parameters": {
"temperature_k": 303,
"form": "bulk",
"technique": "Fourier-transform spectroscopy"
}
}
Table XII, 62.50-250.0 um, tag [19]: Fourier-transform spectroscopy without Kramers-Kronig analysis, 1000 ohm cm, 303 K (p. 550); free-carrier absorption contributes. ‘1.7 [19]’ inherits 10^-4 from Johnson’s 1.08e-4 above it; the column then reaches 7.2e-4 printed with its power at 166.7 um.
Formulas#
No formulas are recorded.
Corrections#
No dataset errata are recorded in this source record.
Formula corrections, where recorded, appear with their formulas above. Curation notes may also discuss corrections or unresolved interpretation. Consult the review register for the checks and decisions.